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13篇 您的检索式:作者名="Zheleva A"
    题名 作者 年代 出处 被引量
1Trusting spam report- ers:a reporter based reputation system for email fil-tering显示文摘Zheleva E Kolcz A Getoor L 2009Acre Transactions on Information Sys- tems2009,27,1:1
2Trusting spam re porters: A reporter-based reputation system for email filtering显示文摘Zheleva E Kolcz A Getoor L 2008ACM Transactions on Informa- tion System(TOIS)2008,27,1:1
3Free radical reactions might contribute to severe alpha amanitin hepatotoxicity--a hypothesis 显示文摘Zheleva A Tolekova A Zhelev M 2007Med Hypotheses2007,69,2:1
4显示文摘Gruss K A Zheleva T Davis R F 1998Surf Coat Technol1998,107,:1
5Structural and chemical comparison of graphite and BN/AIN caps used for annealing ion implanted SiC 显示文摘JONES K A WOOD M C ZHELEVA T S 2008Journal of Electronic Materi- als2008,37,6:1
6Effect of high-temperature anneals on 4H-Si C implanted with Al or Al and Si显示文摘JONES K A SHAH P B ZHELEVA T S 2004Journal of Applied Physics2004,96,10:1
7Graphite and BN/AIN Annealing Caps for Ion Implanted SiC显示文摘Wond M C Jones K A Zheleva T S 2006Material Science Forum2006,,:1
8Growth of Highly (0001)-oriented Aluminum Nitride Thin Films with Smooth Surfaces on Silicon Carbide by Gas-source Molecular Beam Epitaxy显示文摘Jarrendahl K Smith S A Zheleva T 1998Vacumm1998,49,:1
9Solid-State Electron显示文摘Derenge M A Jones K A Kirchner K W Ervin M H Zheleva T S Hullavarad S and Vispute R D 200448:1867-18722004,48,:1
10Solid-State Electron显示文摘Ruppalt L B Stafford S Yuan D Jones K A Ervin M H Kirchner K W Zheleva T S Wood M C Geil B R Forsythe E Vispute R D and Venkatesan T 200347:253-2572003,47,:1
11Transition layers at the SiO2/SiC interface 显示文摘ZHELEVA T LELIS A DUSCHER G 2008Appl Phys Lett2008,221,8:1
12Characterization of zirconium nitride coating deposited by catholic arc sputtering显示文摘GRUSS K A ZHELEVA T DDVIS R F 1998Surface and Coatings Technology1998,,:1
13Growth of highly (0001) -oriented aluminum nitride thin films with smooth surfaces on silicon carbide by gas source molecular beam epitaxy显示文摘Jarrendahl K Smith S A Zheleva T 1998Vacumm1998,49,18:1
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