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20篇 您的检索式：作者名="Saigne F"

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	题名	作者	年代	出处	被引量
1	Extraction purification and properties of aequorin a bioluminescent protein from the luminous hydrornedusan,Aequoreax显示文摘	Shimomura O Iohson F H Saign Y	1962	Cell Comp Physiol1962，59，：	1
2	Extraction, purification properties of aequorin, a biolum in escent protein from the luminous bydromedusan,Aeguorea显示文摘	Shimomura O Iohson F H Saign Y	1962	J Cell Comp Physiol1962，59，：	1
3	Physical Model for the Low - Dose - Rate Effect in Bipolar Devices 显示文摘	Boch J Saigne F Schrimp R D	2006	IEEE Trans Nucl Sci2006，53，6：	1
4	Model for high-temperature radiation effects in NPN bipolar-junction transistors 显示文摘	BOCH J SAIGNE F MANNONI V	2002	IEEE Trans Nuel Sei2002，49，6：	1
5	Methodology for the reliability evaluation of a passive system and its integration into a Probabilistic Safety Assessment显示文摘	Michel Marques Pignatel J F Saignes P	2005	Nuclear Engineering and Design2005，235，：	1
6	Methodologyfor the reliability evaluation of a passive system and itsintegration into a probabilistic safety assessment显示文摘	Marques M Pignatel J F Saignes P	2005	Nuclear Engineering and Design2005，235，24：	1
7	Elevated temperature irradiation at high dose rate of commercial linear bipolar ICs显示文摘	Boch J Saigné F Schrimpf R D	2004	IEEE Trans Nucl Sci2004，51，6：	1
8	Physical model for the low-dose-rate effect in bi- polar devices显示文摘	BOCH J SAIGNE F SCHRIMPF R D	2006	IEEE Trans Nucl Sci2006，53，6：	1
9	Extraction purification and properties of aequorin a bioluminescent protein from the luminous hydromedusan, Aequoreax显示文摘	Shimomura O Iohson F H Saign Y	1962	Cell Comp Physiol1962，59，：	1
10	Methodology for the Reliability Evaluation of a Passive System and Its Integration into a Probabilistic Safety Assessment 显示文摘	Michel Marques Pignatel J F Saignes P at al	2005	Nucl Eng Des2005，235，26：	1
11	Elevated tem- perature irradiation at high dose rate of commercial lin- ear bipolar ICs 显示文摘	Boch J Saign'F Schrimpf R D	2004	IEEE Trans Nucl Sci2004，51，5：	1
12	Temperature effect on geminate recombination 显示文摘	Boch J Saigne F Dusseau L	2006	Appl Phy Lett2006，89，04：	1
13	Model for high-temperature radiation effects in N-P-N bipolar-junction transistors显示文摘	BOCH J SAIGNE F MANNONI V	2002	IEEE Trans Nucl Sei2002，49，6：	1
14	Physical model for the low-dose-rate effects in bipolar devices 显示文摘	Boch J Saigne F Schrimpf R D	2006	IEEE Trans Nucl Sci2006，53，6：	1
15	Temperature effect on geminate recombination显示文摘	BOCH J SAIGNE F DUSSEAU R D	2006	Appl Phys Lett2006，89，：	1
16	An integrated sensor using optically stimulated luminescence for in-flight dosimetry显示文摘	Dusseau L Plattard D Vaille JR Polge G Ranchoux G Saigne F	2000	IEEE Transactions on Nuclear Science2000，47，：	1
17	Methodology for the Reliability Evaluation of a Passive System and its Integration into a Probabilistic Safety Assessment显示文摘	MICHEL MARQUES PIGNATEL J F SAIGNES P		0，，24：	1
18	Methodology for the reliability evaluation of a passive system and its integration into a probabilistic safety assessment显示文摘	MARQUES M PIGNATEL J F SAIGNES P		0，，24：	1
19	Prediction of low dose-rate effects in power metal oxide semiconductor field effect transistors based on isochronal annealing measurement显示文摘	DUSSEAU L SAIGNE F R	1997	J Appl Phys1997，81，5：	1
20	Physical model for the low dose rate effect in bipolar devices显示文摘	BOCH J SAIGN F SCHRIMPF R D		0，，06：	1

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