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2篇 您的检索式:作者名="L.I.Kiseleva"
    题名 作者 年代 出处 被引量
1Possibilities of the practical use of a stationary strain gradient in the interelectrode volume of unpolarized ferroceramic plates显示文摘It has been established that in plates made of hot-pressed ferroelectric ceramics PZT-19(Tc=300℃),after metal electrodes from Ag are burned into opposite surfaces with different depths of mechanical damage,counter-directional stationary deformation gradients and,accordingly,internal electric displacement fields create a stationary flexoelectric effect.As a result,unpolarized ceramics below the Curie temperature become a pyroelectric,and above it become a pyroelectric bolometer.After polishing the less damaged surface and replacing the Ag(valency v=3)electrode with Cr(v=6)by thermal evaporation in vacuum from the intact surface,a new thermally stable polarization is created,directed from the damaged surface in the interelectrode volume.Such plates have an asymmetric dielectric hysteresis loop,retain the values of the pyroelectric effect and piezoelectric effect in the ferroelectric phase,as well as the bolometric effect in the paraelectric phase after repeated heating cycles to 400℃ and cooling to T_(norm).Yu.N.Zakharov V.P.Sakhnenko I.A.Parinov I.P.Raevsky M.A.Bunin V.A.Chebanenko M.A.Zaerko E.I.Sitalo A.A.Pavelko L.I.Kiseleva 2020Journal of Advanced Dielectrics2020,10,1:0
2Optical properties of Sr_(x)Ba_(1−x)Nb_(2)O_(6)nanoscale films(x=0.5 and 0.61)grown by RF-cathode sputtering in an oxygen atmosphere显示文摘The research findings of the phase composition,nanostructure and optical properties of strontium-barium niobate thin films are discussed.Sr_(x)Ba_(1−x)Nb_(2)O_(6)nanosized films(x=0.5 and 0.61)were characterized by XRD,SEM and AFM studies.Reflective multi-angle ellipsometry and spectrophotometry were used to determine the optical parameters(refractive index,its dispersion,and thickness of the damaged surface layer)of thin films.It was shown that SBN-50 and SBN-61 thin films were grown c-oriented on Al_(2)O_(3)(0001)and heteroepitaxial on MgO(001)substrates.The increase of refractive index,approaching its maximum value in the bulk material for a given composition as the film thickness increases,is observed.S.V.Kara-Murza K.M.Zhidel N.V.Korchikova Yu.V.Tekhtelev A.V.Pavlenko L.I.Kiseleva 2021Journal of Advanced Dielectrics2021,11,5:0
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