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| 1 | Deep crustal structure of Baiyun Sag, northern South China Sea revealed from deep seismic reflection profile显示文摘This paper discusses deep crustal architecture of the Baiyun Sag of the Pearl River Mouth Basin, northern South China Sea based on velocity analysis, time-depth con- version and seismic interpretation of the deep seismic reflec- tion profile DSRP-2002. The profile was acquired and proc- essed to 14 S TWT by the China National Offshore Oil Corp. (CNOOC) in 2002. It extends across the Baiyun Sag of the Pearl River Mouth Basin, from the northern continental shelf of the SCS to the deepwater province. As the first deep seismic reflection profile in the Pearl River Mouth Basin,this profile reveals seismic phases from basement down to upper most mantle. The Moho surface appears in the profile as an undulating layer of varying thickness of 1-3 km. It is not a single reflector interface, but a velocity gradient or intercon- version layer. The crust thins stepwisely from the shelf to the continental slope and the abyssal plain (from north to south), and also thins under depocenters. The crustal thickness is only 7 km in the depocenter of the main Baiyun Sag, which corresponds to a Moho upwelling mirroring the basement topography. In the lower slope and the ocean-continental transition zone of the southernmost portion of the profile, three sub-parallel, NW-dipping strong reflectors found at depths around 10-21 km are interpreted as indications of a subducted Mesozoic oceanic crust. Crustal faults exist in the northern and southern boundaries of the Baiyun Sag. The intense and persistent subsidence of the Baiyun Sag might be related to the long-term activity of the crustal faults. | HUANGChunju ZHOUDi SUNZhen CHENChangmin HAOHujun | 2005 | Chinese Science Bulletin2005，50，11： | 47 |
| 2 | Recent progress of deep seismic experiments and studies of crustal structure in northern South China Sea显示文摘The South China Sea (SCS) is one of the largest marginal seas in the western Pacific. Its northern part has the features of a passive continental margin. The studies of deep crustal structure in this area are very important for understanding the tectonic nature, evolution history, basin formation of the northern margin, and the origin of the SCS. In the past decades, the deep seismic experiments of crustal studies in the northern SCS have gone through three stages, namely the sonobuoy, two-ship Expanding Spread Profile (ESP), and Ocean Bottom Hydrophone/Seismometer (OBH/OBS). Along the continental slope, the sonobuoy experiments provided useful information about the velocity structure of the upper crust, while the ESP data recorded for the first time the seismic signals from deep crustal structure and Moho interface. And the OBH/OBS profiles revealed the crustal structure in much greater detail. This paper first gives a brief historical review of these deep seismic experiments and studies, then a summary of the latest progress and important research results. The remaining problems and suggestions for further research work are presented as conclusive remarks. | QIUXuelin SHIXiaobin YANPin WUShimin ZHOUDi XIAKanyuan | 2003 | Progress in Natural Science:Materials International2003，13，7： | 19 |
| 3 | H_∞ SYNCHRONIZATION CONTROL OF LINEAR SYSTEMS AND ITS APPLICATION TO WAFER-RETICAL STAGE显示文摘For the outputs of two nth-order linear control systems to work in synchronization and meanwhile to track their commands, a H∞ synchronization control scheme is presented. In terms of two uncoupled single variable linear systems, a multivariable coupled system is established by choosing one output and the difference of the two outputs as a new output vector, so that both command tracking and synchronization properties can be demonstrated by a H∞ performance index. To improve the synchronization and tracking performance and to guarantee the system robust stability, the mixed sensitivity H∞ design methodology is adopted. The presented synchronization scheme is then extended to the case where one of the two systems include two input variables, and then applied to the position synchronization control of a wafer-retical stage. The wafer-reticle stage consists of a wafer stage, a reticle coarse stage, and a reticle fine stage. The reticle coarse stage picks up the reticle fine stage. The three stages ought to tack their commands, but synchronization between the wafer stage and the reticle fine stage must be stressed in the tracking process. In the application, by appropriately determining the weighting matrices for the sensitivity function and the complementary sensitivity function, a satisfactory H∞ synchronization controller is obtained to realize highly accurate position synchronization,and to guarantee tracking performance. The above results are verified by simulation experiments. | ZhouDi | 2005 | Chinese Journal of Mechanical Engineering2005，18，2： | 5 |
| 4 | Estimatingeconomicimpactsfromtourism显示文摘 | ZHOUDY JOHNFY UJJAYANTC | 1996 | Annalsof Tourism Research1996，，24： | 1 |
| 5 | Drugsensitivityofextended-spectrump-lactamasesproducingin50strains[J]显示文摘 | ZHOUDY SHENJ ZHOUM | | 临床合理用药0，，： | 1 |
| 6 | Two-step measurement update for extended Kalman filtering显示文摘The nonlinear filtering for a class of discrete-time stochastic dynamic systems whose measurement equations contain linear (or universal linearizable) components and nonlinear components which are mutually statistical independent is investigated. A two-step measurement update is proposed for the filtering of the systems. The first-step update is a linear (or universal linearization) measurement correction which introduces an intermediate estimate, while the second-step nonlinear linearization update produces the final posterior estimate based on the first-step estimate. Since the first measurement correction is a linear or universal linearization update, it provides an accurate linearization reference point for the second nonlinear measurement update. Two simulation examples show superiority of the new estimation method. | ZhangYong'an ZhouDi DuanGuangren | 2005 | Journal of Systems Engineering and Electronics2005，16，1： | 0 |
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