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13篇 您的检索式:作者名="ZALAR A"
    题名 作者 年代 出处 被引量
1Reduction of Thin Oxide ThinLayer on Fe60Ni40 Subsrtates in Hydrogen Plasma 显示文摘Mozetic M Zalar Drobinc A 1999ThinSolid Films1999,,:1
2A method of studying carbon particle distribution in paint films显示文摘MOZETIC M ZALAR A PAN JAN P BELEM PEJOVNIK S GRMEK R 2000Thin Sol Films2000,376,11:1
3Depth dependences of the ion bombardment induced roughness and of the interdiffusion coefficient for Si/Al multilayers显示文摘J.Y Wang A Zalar E.J Mittemeijer 2003Applied Surface Science2003,,1:1
4Composition of the sputter deposited W-Ti thin films显示文摘BUNDALESKI N PETROVIC S PERUSKO D KOVAC J ZALAR A 2008Applied Surface Science2008,254,20:1
5A continuous electrical resistivity measurement in thin films显示文摘CVELBAR A PANJAN P NAVIN(S)EK B ZALAR A BUDNAR M TRONTELJ L 1995Thin Solid Film1995,270,12:1
6Depth dependences of the ion bombardment induced roughness and of the interdiffusion coefficient for Si/A1 muhilayers 显示文摘Wang J Y Zalar A Mittemeijer E J 2004Applied Surface Science2004,222,:1
7Studies in Porphyria Ⅶ Induction of uroporphyrinogen-Ⅰ synthase and expressions of the gene defect of acute intermittent porphyria in mitogen-stimulated human lymphocytes显示文摘Sassa Zalar G L Kappas A 1978Clin Invest1978,61,:1
8XPS study of oxygen plasma activated PET 显示文摘Vesel A Mozetic M Zalar A 2008Vacuum2008,82,2:1
9Interfacial reactions in Al_2O_3/Ti, Al_2O_3/Ti_3Al and Al_2O_3/TiAl bilayers显示文摘A Zalar B M M baretzky S Hofmann 0,,:1
10Characterization of intermetallic phases and oxides formed in annealed Ni/Al multilayer structures显示文摘Zalar A Hofmann S Kohl D 1995Thin Solid Films1995,270,12:1
11Improved depth resolution by Sample rotation during Auger electron spectroscopy depth profiling显示文摘Zalar A 1985Thin Solid Films1985,124,34:1
12Self-controlled diffusion of Al in Cu thin film显示文摘Mozetic M Zalar A Drobnic M 1998Vacuum1998,50,12:1
13Improved depth resolution by sample rotation during Auger electron spectroscopy depth profiling 显示文摘Zalar A 1985Thin Solid Films1985,124,34:1
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