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49篇 您的检索式：作者名="HOCKEN R"

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	题名	作者	年代	出处	被引量
1	The long-range scanning stage: a novel platform for scanned probe microscopy 显示文摘	HOLMES M HOCKEN R TRUMPER D	2000	Prec Eng2000，24，3：	1
2	Three Dimensional Metrology 显示文摘	HOCKEN R SIMPSON J A BORCHARDT B	1977	Annals of the CIRP1977，26，1：	1
3	Three dimensional metrology 显示文摘	Hocken R Simpson A J	1977	Annals of the CIRP1977，26，2：	1
4	Automatic Laser Tracking Interferometer System for Robot Metroloty显示文摘	Lau K Hocken R J Haight W C	1986	Precision Engineering1986，8，1：	1
5	Three Dimensional Metrology显示文摘	HOCKEN R SIMPSON J A	1997	Annals of the CIRP1997，26，：	1
6	Dynamics and control of the UNCC/MIT sub-atomic measuring machine显示文摘	Trumper D L Wang C	2001	Annals of the CIRP2001，50，1：	1
7	A general meth- odology for machine tool accuracy enhancement by error compensa- tion 显示文摘	Donmez M A Blomquist D S Hocken R J	1986	Precision Engineering1986，8，4：	1
8	Self- calibration reversal, redundancy, error separation, and ' absolute testing' 显示文摘	EVANS C J HOCKEN R J ESLER W T	1996	ClRP Annals1996，45，2：	1
9	A Survey of Current Robot Metrology Methods显示文摘	Lau K Hocken R J	1984	Annals of the CIRP1984，33，2：	1
10	Dynamic and control of the UNCC/MIT sub-atomic measuring machine 显示文摘	HOCKEN R J TRUMPER D L WANG C	2001	CIRP Annals2001，50，1：	1
11	Automatic laser tracking interferometer system for robot metrology显示文摘	Lau K Hocken R J Haight W C		0，，01：	1
12	Self-calibration:reversal,redundancy,error separation,and ‘absolute testing'显示文摘	Evans C J Hocken R J Estler W T	1996	Annals of the CIRP1996，452，：	1
13	Three dimensional metrology显示文摘	Simpson J Borchardt B	1977	The CIRP Annals1977，26，2：	1
14	A general methodology for machine tool accuracy enhancement by error compensation 显示文摘	DONMEZ M A BLOMQUIST D S HOCKEN R J	1986	Precision En- gineering1986，8，4：	1
15	CAD-directed inspection显示文摘	HOPP T H HOCKEN R J	1984	CIRP Annals : Manufacturing Technology1984，33，1：	1
16	Constructuion and testing of a nanomachining instruments 显示文摘	GAO W HOCKEN R J PATTEN J A at al	2000	Precision Engineering2000，24，4：	1
17	Experiments using a nano-machining instrument for nano-cutting brittle materials显示文摘	GAO W HOCKEN R J PATTERN J A	2000	Annals of the CIRP2000，49，1：	1
18	The long- range scanning stage: a novel platform for scanned probe microscopy 显示文摘	Holmes M L Hocken R J Trumper D L	2001	Precision Engineering2001，24，3：	1
19	Sampling issues in coordinate metrology显示文摘	Hocken R J Raja J Babu U	1993	Manufacturing Review1993，6，4：	1
20	Error compensation of coordinate measuring machines 显示文摘	Zhang G Veale R Charhon T Borchardt B Hocken R	1985	Annals of the CIRP1985，34，1：	1

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