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28篇 您的检索式：作者名="DEVINE R A B"

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	题名	作者	年代	出处	被引量
1	显示文摘	Hutson J M Devine R A B	2004	J Appl Phys2004，95，：	1
2	Ion implantation-and radiation-induced structural modifications in amorphous SiO2显示文摘	Devine R A B	1993	J Non-Cryst Solids1993，152，：	1
3	Tantalum Pentoxide ( Ta2 05 ) Thin Films for Advanced Dielectric Applications 显示文摘	Chaneliero C Autran J L Devine R A B	1998	Materials Science and Engineering1998，22，：	1
4	Tantalum pentoxide(Ta2Os) thin films for advanced dielectric applications显示文摘	CHANELIERE C AUTRAN J L DEVINE R A B BALLAND B	1998	Materials Science and Engineering R1998，22，：	1
5	Molecular volume and electronic and vibrational polarizibilities for amorphous LaAlO3 显示文摘	Busani T Devine R A B	2004	J Appl Phys2004，96，：	1
6	Tantalum Pentoxide (Ta200 Thin Films for Advanced Dielectric Applications 显示文摘	Chaneliere C Autran J L Devine R A B	1998	Materials Science and Engineering1998，22，：	1
7	Dielectric and infrared properties of TiO2 films containing anatse and rutile显示文摘	BUSANI T DEVINE R A B	2005	Semiconduct Semiconduct Sei Technol2005，20，8：	1
8	显示文摘	Chaneliere C Autran J L Devine R A B	1998	Mater Sci Eng R1998，22，：	1
9	Dielectric and infrared properties of TiO2 films containing anatase and rutite 显示文摘	Busani T Devine R A B	2005	Semicond Sci Technol2005，20，：	1
10	Analysis of the vibrational mode spectra of amorphous SiO2films显示文摘	MARTINET C DEVINE R A B	1995	J Appl Phys1995，77，9：	1
11	Nondestructive measurement of interfacialSiO2 films formed during deposition and annealing of Ta2O5 显示文摘	DEVINE R A B	1996	Applied Physics Letters1996，68，14：	1
12	Structural nature of the Si/SiO2 interface through infrared spectroscopy显示文摘	Devine R A B	1996	Applied Physics Letters1996，68，22：	1
13	Comparison of experimental andcalculated TO and LO oxygen vibrational modes in thin Si02films 显示文摘	Martinet C Devin R A B	1995	Journal of Non - Crystalline Solids1995，187，：	1
14	Oxygen gettering and oxide degradation during annealing of Si/SiO2/Si structures 显示文摘	DEVINE R A B WARREN W L XU J B	1995	Applied Physics Letter1995，77，1：	1
15	Posttraumatic growth in young adults who experienced serious childhood illness: a mixed-methods approaeh显示文摘	Devine K A Reed Knight B Loiselle K A Fenton N Blount R L	2010	J Clin Psychol Med Settings2010，17，：	1
16	Radiationinduced charge trapping in low-k silsesquioxane-based intermetal dielectric films显示文摘	Devine R A B Tringe J W Chavez J R	2002	IEEE T NUCL SCI 20022002，，：	1
17	Ion implantation-and radiation-induced structural modifications in amorphous SiO2显示文摘	DEVINE R A B	1993	J Non-Cryst Solids1993，152，：	1
18	Tantalum pentoxide (Ta2Os) thin fi ms for advanced die eetr c app icat ons 显示文摘	CHANELIERE C AUTRAN J L DEVINE R A B	1998	Mater Sci Eng1998，22，6：	1
19	Structural nature of the SilSi02 interface through infrared spectroscopy显示文摘	DEVINE R A B	1996	Applied Physics Letters1996，68，22：	1
20	Analysis of the vibrational mode spectra of amorphous Si02 films显示文摘	MARTINET C DEVINE R A B	1995	Journal of Applied Physics1995，77，9：	1

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