维普期刊资源整合服务平台（V6.5）

22篇 您的检索式：作者名="CARTIER E A"

选中清除导出查看参考文献查看引证文献引用追踪共2页首页上一页第1页下一页末页 /2 跳转

	题名	作者	年代	出处	被引量
1	Origin of the threshold voltage instability in SiO2/HfO2 dual layer gate dielectrics 显示文摘	KERBER A CARTIER E PANTISANO L	2003	IEEE EDL2003，24，2：	1
2	Passivation and interface state density of SiO/HfO-based/polycrystalline-Si gate stacks 显示文摘	Carter R J Cartier E Kerber A	2003	Applied Physics Letters2003，，：	1
3	The herpes simplex virus-1 Us3 protein kinase blocks CD8T cell lysis by preventing the cleavage of Bid by granzyme B 显示文摘	Cartier A Broberg E Komai T	2003	Cell Death Differ2003，10，12：	1
4	Determinants of potency on alpha-conotoxin MII,a peptide antagonist of neuronal nicotinic receptors显示文摘	Everhart D Cartier G E Malhotra A	2004	Biochemistry2004，43，10：	1
5	Single-residue al- teration in alpha-conotoxin PnlA switches its nAChR sub- type selectivity 显示文摘	Luo S Nguyen T A Cartier G E	1999	Biochem1999，38，14：	1
6	Ef- fective electron mobility in Si inversion layers in metal-oxide semiconductor systems with a high-k insulator: the role o{ re mote phonon scattering 显示文摘	FISCHETTI M V NEUMAYER D A CARTIER E A	2001	Journal of Applied Physics2001，90，9：	1
7	Single-residue alteration in α-conotoxin PnIA switches its nAChR subtype selec tivity显示文摘	Luo S Nguyen T A Cartier G E	1999	Biochemistry1999，38，14：	1
8	A pathologic cascade leading to synaptic dysfunction in alpha-synuclein-induced neurodegeneration显示文摘	Scott D A Tabarean I Tang Y Cartier A Masliah E Roy S	2010	J Neurosci2010，30，：	1
9	Effective electron mobility in Si inversion layers in metaloxide-semiconductor systems with a high-insulator:The role of remote phonon scattering显示文摘	Fischetti M V Neumayer D A Cartier E A	2001	J Appl Phys2001，90，9：	1
10	Effective electron mobility in Si inversion layers in metaloxide semiconductor systems with a high-k insulator:the role of remote phonon scattering 显示文摘	FISCHETTI M V NEUMAYER D A CARTIER E A	2001	J Appl Phys2001，90，3：	1
11	Atomic beam deposition of lanthanum-and yttrium-based oxide thin films for gate dielectrics 显示文摘	Guha S Cartier E Gribelyuk M A	2000	Appl Phys Lett2000，77，17：	1
12	Physical and electrical characterization of Hafnium oxide and Hafnium silicate sputtered films显示文摘	Callegari A Cartier E Gribelyuk M	2001	J Appl Phys2001，90，：	1
13	Atomic beam deposition of lanthanum- and yttrium-based oxide thin films for gate dielectrics显示文摘	S Guha E Cartier M A Gribelyuk		0，，：	1
14	Physical and Electrical Characteristics of Hafnium Oxide and Hafnium Silicate Sputtered Films显示文摘	Callegari A Cartier E Gribelyuk M	2001	J Appl Phys2001，，90：	1
15	Origin of the threshold voltage instability in SiOdHtO2 dual layer gate dielectrics显示文摘	KERBER A CARTIER E PANTISANO L	2003	IEEE Eleetron Device Letters2003，24，2：	1
16	Materials characterization of ZrO2-SiO2 and HfO2-SiO2 binary oxides deposited by chemical solution deposition显示文摘	NEUMAYER D A CARTIER E	2001	Journal of Applied Physics2001，90，4：	1
17	Physical and electrical characterization of hafnium oxide and hafnium silicate sputtered films显示文摘	Callegari A Cartier E Gribelyuk M	2001	J Appl Phys2001，90，：	1
18	Materials characterization of ZrO2 -SiO2 and HfO2 -SiO2 binary oxides deposited by chemical solution deposition 显示文摘	Neumayer D A Cartier E	2001	J Appi Phys2001，90，4：	1
19	Threshold voltage instabilities in high-k gate dielectric stacks 显示文摘	Zafar S Kumar A Gusev E Cartier E	2005	IEEE Trans Dev Mater Reliab2005，5，：	1
20	Visceral obesity and plasma glucose-insulin homeostasis: contributions of interleukin-6 and tumor necrosis factor-alpha in men显示文摘	Cartier A Lemieux I Aim e ras N	2008	Clin Endocrinol Metal)2008，93，5：	1

返回顶部每页显示：

共2页首页上一页第1页下一页末页 /2 跳转

互联网出版许可证新出网证(渝)字10号全国400电话 - 免长途话费

用户提示