Scanning Tunneling Microscope Observations of Non-AB Stacking of Graphene on Ni Films

查看全文 作　　者：Ruiqi [1,2]Zhao;Yanfeng [1,3]Zhang;Teng [1]Gao;Yabo [1]Gao;Nan [1]Liu;Lei [1]Fu;Zhongfan [1]Liu 机构地区：[1]Center for Nanochemistry (CNC), Beijing National Laboratory for Molecular Sciences, State Key Laboratory for Structural Chemistry of Unstable and Stable Species, College of Chemistry and Molecular Engineering, Peking University, Beijing 100871, China;[2]College of Physics and Chemistry, Henan Polytechnic University, Henan 454003, China;[3]Department of Advanced Materials and Nanotechnology, College of Engineering, Peking University, Beijing 100871, China 出　　处：《Nano Research》索引2011年第4卷第7期,共10页 基　　金：Acknowledgements This work was financially supported by the National Natural Science Foundation of China (Grant Nos. 20973013, 51072004, 50821061, 20833001, 21073003, 20973006, and 50802003) and the Ministry of Science and Technology of China (Grant Nos. 2007CB936203, 2011CB921903, and 2009CB929403). Ruiqi Zhao also thanks the Doctoral Foundation of Henan Polytechnic University (Grant No. B2009-90). 摘　　要：graphene 的显微镜的特征在化学 transferincluding 以前在 Ni 电影上分离了单层和 bilayers 的原子结构, Moir ? 敷敲映牯敭 ? 祢爠汯楬杮甠? 景琠敨愠湮慥敬 ? 佇 ? 湡 ? 桴 ? 楤浡瑥牥 ? 敷敲洠獯汴 ? 湩琠敨爠湡敧 ??? 关 键 词：扫描隧道显微镜 镍薄膜 显微镜观察 石墨 堆叠 显微分离 原子结构 高分辨率